隔离放大器的测试方法研究  

Testing Technology of Isolation Amplifier

作　　者：邱云峰 张世艳 

机构地区：[1]贵州航天计量测试技术研究所,贵阳550009

出　　处：《计算机与数字工程》2015年第1期97-99,123,共4页Computer & Digital Engineering

摘　　要：近年来隔离放大器的指标在不断提高,性能也在不断提升,应用范围越来越广,伴随着隔离放大器的发展,对用来考核放大器指标的测试技术也提出了相应的要求。论文针对常用的隔离运算放大器AD204,结合测试标准,研究其测试方法、设计了测试电路,提出了提高测试参数准确性的几项措施,实现了对AD204重要参数指标的测试。In recent years,the technology of isolation amplifier continues to improve,the performance is also rising,more and more isolation amplifiers are applied to the instrument,communication and other fields.With the development of the isolated amplifier,it also sets a higher request to the test technology of amplifier index.Combined with the test standard,this paper studies the testing method,designs the test circuit,raises several measures to improve the accuracy of the test parameters.

关 键 词：隔离放大器 失调电压 开环增益 电流调整率 

分 类 号：TN406[电子电信—微电子学与固体电子学]