对数放大器理想特性直线拟合算法分析  

Analysis of Ideal Transfer Fitting Curve Measurement for Log Amplifier

作　　者：张天星[1] 庞佑兵[1] 

机构地区：[1]中国电子科技集团公司第二十四研究所,重庆400060

出　　处：《微电子学》2015年第1期104-107,共4页Microelectronics

摘　　要：结合对数放大器的对数斜率及动态范围等关键参数的定义,讨论了最小二乘法、最小一乘法及最佳直线法三种线性拟合法则在对数放大器测量中的应用,分析和验证了不同算法对理想特性直线及测量的影响。最佳直线法的最大绝对值最小法则相比于其他拟合法,更适用于线性区间和线性度的拟合,计算精度高,并在实例分析中得到验证。Based on the definitions of the log amplifier’s key parameters such as log slope and dynamic range,the least squares method,least absolute deviation method and best-fit straight line method were discussed for the application in log amplifier measurement.The effects on the ideal characteristics and parameter measurement under different algorithms were analyzed and verified in detail.Compared to other fitting curve methods,the maximum absolute value and least rules of best-fit straight line method was more suitable to the fitting of linear region and linearity,which could improve the precision of log amplifier’s measurements directly.It was verified through the analysis of experimental examples.

关 键 词：对数放大器 对数斜率 线性拟合 线性度 

分 类 号：TM46[电气工程—电器]