CCD像元灵敏度非均匀性及处理方法研究  

Research on Pixel Sensitivity Nonuniformity and Treatment Method of CCD

作　　者：郭雨蓉[1] 李小波[2] 王锴磊 崔桂利 赵天承 

机构地区：[1]北京航天计量测试技术研究所,北京100076 [2]二炮驻首都航天机械公司军事代表室,北京100076

出　　处：《宇航计测技术》2014年第4期41-44,共4页Journal of Astronautic Metrology and Measurement

摘　　要：研究了CCD像元灵敏度非均匀性产生的原理和给CCD应用带来的问题。采用改进的归一化算法对CCD像元灵敏度进行修正,解决了CCD图像传感器由于加工工艺造成的各像元光电灵敏度具有差异的问题。该方法有效的减小了CCD的原始误差,对提高CCD测量准确度具有重要意义。The principle of causing the pixel response nonuniformity of CCD and the problems of CCD application are researched. An improved normalization algorithm is used by the method. Because of the arts and crafts,every pixel of charge coupled device has a different sensitivity. This problem can be solved by this algorithm. And the source error can be reduced effectively. It has a great significance to improve the measurement accuracy of CCD.

关 键 词：电荷耦合器件 图像传感器 灵敏度 非均匀性 

分 类 号：O435[机械工程—光学工程]