500kV并联电抗器高压套管末屏故障分析及结构改造  

Fault Analysis and Design Improvement of 500 kV Shunt Reactor High Voltage Casing Bushing Test Tap

作　　者：张松林 王亚平 黄智 田晓云 岳永刚 

机构地区：[1]内蒙古超高压供电局,呼和浩特010080

出　　处：《内蒙古电力技术》2015年第1期62-64,共3页Inner Mongolia Electric Power

摘　　要：在500kV永丰Ⅰ线预防性试验过程中发现高压并联电抗器W相套管末屏有明显烧损痕迹。通过对现场高压电气试验和套管油色谱试验结果分析,确定故障原因为套管末屏外引接地铜杆接地不良,悬浮电位放电,导致套管油色谱异常。对发生故障的顶针式末屏结构缺陷进行分析,并改造为双重接地结构,解决了末屏易损坏、接地不良等问题。In the pre-trial process of Yongfeng line I, high voltage electrical testing personnel found that W-phase high voltage casing bushing test tap of shunt reactor had obvious burn marks. Through high voltage electrical tests and oil chromatographic analysis, identified that the poor grounding of the grounding copper rods at the end of the casing lead to floating potential discharge and oil chromatography exception. For this bushing test tap fault, relevant staff proposed double grounding suggestion for bushing test tap design and the improvement can effectively eliminate the floating potential discharge accidents.

关 键 词：并联电抗器 高压套管 末屏 油色谱 悬浮电位放电 

分 类 号：TM472[电气工程—电器]