红外焦平面阵列坏元检测算法  

A Bad-Pixel Detection Algorithm for Infrared Focal Plane Array

作　　者：李炎冰[1] 梁少峰 陈洪亮[1] 雷波[1] 

机构地区：[1]中国航空工业集团公司洛阳电光设备研究所,河南洛阳471000 [2]空装重点型号部,北京100843

出　　处：《电光与控制》2015年第3期69-71,共3页Electronics Optics & Control

摘　　要：红外焦平面阵列器件因为制造材料、工艺的影响,难免存在坏元问题,降低了红外图像的质量,影响检测系统的检测概率和虚警率。描述了坏元的特性,分析了其产生机理,利用其特点给出了多帧分析检测坏元的算法。仿真结果表明,该方法简洁可靠,易于实现。最后利用中值滤波法将检测到的坏元进行了补偿。Infrared focal plane array device inevitably exists bad pixels due to the impact of manufacturing materials, technology and other factors, which may reduce the image quality and affect the detection probability and false alarm rate of the system. In this article, analysis is made to the characteristics of the bad pixels and their generating mechanism. An algorithm for detecting bad pixels by analyzing multiple frames of the image is presented. The simulation results show that this method is simple, reliable, and easy for implementation. Finally, median filter is used to compensate the bad pixels detected.

关 键 词：红外焦平面阵列 坏元检测 坏元补偿 

分 类 号：TP317.4[自动化与计算机技术—计算机软件与理论]