一种用于筛选高可靠性FPGA的硬件测试电路  

Hardware testing circuit which is used for screening high-reliability FPGA

作　　者：张磊[1] 贺强民[1] 包斌[1] 

机构地区：[1]北京空间机电研究所,北京100094

出　　处：《电子测量技术》2015年第2期68-73,共6页Electronic Measurement Technology

摘　　要：在空间遥感器电子产品设计中,对电子产品可靠性的要求越来越高,通过老炼试验和其他环境试验,从低等级电子元器件中筛选出符合要求的高等级电子元器件是目前航空航天行业普遍采用的一种方法。提出一种FPGA筛选测试电路,结合老炼试验及抗辐照试验,可从低等级FPGA中筛选出具有高可靠性和抗辐照特性的高等级FPGA芯片。该筛选测试电路在实际应用过程中,能够全面覆盖被筛选FPGA的所有关键电气特性,筛选测试结果能够准确反映被筛选FPGA在老炼试验和抗辐照试验前后的性能变化。In the product design of space remote sensing electronics,it requires electronic products with high-reliability.This is a widely used method in aerospace industry that selecting the high-level electronic components from the low level electronic components by Burn-In test and the other environmental tests.This paper proposes a Screening Testing Circuit that combined with Burn-In Test and Radiation Exposition Test,it can pick up the components which have the High-Reliability and Radiation Immunity characteristics from the low class FPGA.In practice,this circuit can cover all the FPGA＇s key electrical characters,and the screening test results can show the changes of the selected FPGA＇s performance accurately after the Heat Run and the Radiation Exposition Test.

关 键 词：高可靠性 筛选测试电路 老炼试验 抗辐照试验 FPGA 

分 类 号：TN7[电子电信—电路与系统]