The Mexican hat effect on the delamination buckling of a compressed thin film  

作　　者：Yin Zhang Yun Liu 

机构地区：[1]State Key Laboratory of Nonlinear Mechanics (LNM),Institute of Mechanics, Chinese Academy of Sciences [2]Faculty of Information and Automation,Kunming University of Science and Technology

出　　处：《Acta Mechanica Sinica》2014年第6期927-932,共6页力学学报（英文版）

基　　金：supported by the National Natural Science Foundation of China(11023001 and 11372321)

摘　　要：Because of the interaction between film and substrate,the film buckling stress can vary significantly,depending on the delamination geometry,the film and substrate mechanical properties.The Mexican hat effect indicates such interaction.An analytical method is presented,and related dimensional analysis shows that a single dimensionless parameter can effectively evaluate the effect.Because of the interaction between film and substrate,the film buckling stress can vary significantly,depending on the delamination geometry,the film and substrate mechanical properties.The Mexican hat effect indicates such interaction.An analytical method is presented,and related dimensional analysis shows that a single dimensionless parameter can effectively evaluate the effect.

关 键 词：BUCKLING DELAMINATION Elastic foundation Thin film Compliant substrate 

分 类 号：O344.1[理学—固体力学]