低死时间单道脉冲幅度分析器的电路优化及实验验证  

Circuit Optimization and Experimental Verification of Low Dead-Time Single Channel Analyzer

作　　者：赵修良[1] 雷龙[1] 程晓龙[1] 周剑良[1] 金晓峰[1] 曹舟[1] 

机构地区：[1]南华大学核科学技术学院,衡阳421001

出　　处：《核电子学与探测技术》2014年第11期1275-1278,共4页Nuclear Electronics & Detection Technology

基　　金：国家军品配套项目(JPPT-115-5-882)

摘　　要：低死时间单道脉冲幅度分析器电路在输入高频信号时产生自激现象,且电路本身还存在峰位检测输出信号延迟、逻辑芯片误触发的问题,导致单道无法正常工作。针对这些问题,在低死时间单道设计原理的基础上进行了电路优化,主要改善了有源微分电路,增加了延迟电路,以及单稳态成形电路,并进行了实验验证。实验结果表明,该优化电路不仅可行,而且能够在输入正弦波信号频率高达2.2MHz时正常稳定工作。During the debugging of the circuit of the low dead- time single channel analyzer,some problems were found,such as high- frequency signal would produce self- excited oscillation,the output of peak position detection would be delayed and when height of input pulse was higher than the threshold of the upper discriminator that would make a wrong output in the logic circuit. All of these cause the low dead- time single channel analyzer to not work properly. By analyzing the principle of Low dead- time single channel analyzer,some improvements are made in the circuit of low dead- time single channel analyzer,including active differential circuit,time- delay circuit and mono- stable trigger circuit. Experimental results showed that the optimized circuit is not only feasible,but also can work properly and reliably when the sine wave input signal frequency increased up to 2. 2 MHz.

关 键 词：低死时间 单道脉冲幅度分析器 峰位检测 电路优化 

分 类 号：TL822[核科学技术—核技术及应用]