基于STM32F103VF测试某型导弹发控设备的测试精度与参数设计  

Missile Launch Control Equipment Test Precision and Parameters Based on STM32F103VF

作　　者：马秉亮[1] 朱琳[1] 徐金榜[1] 沈安文[1] 

机构地区：[1]华中科技大学自动化学院,武汉430074

出　　处：《计算机与数字工程》2015年第2期187-190,219,共5页Computer & Digital Engineering

摘　　要：为实现装备保障快速检测、修理与维护,基于对STM32F103VF系列微控制器的研究,开发新型采集测试系统。文章主要对测试通道设计和精度需求进行分析,并应用于测试某型便携导弹发控设备,满足对装备实测要求,降低了电源的要求,大大缩小测试电路的尺寸,对测试设备实现了极大的小型化和便携化[1],同时满足战场快速技术保障的战斗力要求。To achieve rapid detection ,support and maintenance for equipment support ,a new testing system based on the series of STM32F103VE microcontrollers is developed .The test channels design and precision needs are analyzed ,and the testing of a certain type of the missile launch and control equipment is realized .The experiment result shows that the tes‐ting system is fully able to meet the requirements of the equipment ,reduce power requirements ,and significantly decrease the size of the test circuit .It makes test equipment achieve a greatly miniaturized and portable ,and meet the rapid technolog‐ical safeguards requirements of battlefield combat at the same time .

关 键 词：STM32F103VF 微控制器 通道 发控设备 

分 类 号：TP29[自动化与计算机技术—检测技术与自动化装置]