含光储微网的配电网可靠性影响研究  

Reliability of the distribution network with the access of photovoltaic-battery micro grid access

作　　者：杨海晶[1] 李朝晖[1] 宋宁希[2] 陈上吉[2] 尚德华[3] 刘洁[3] 于泷泽 

机构地区：[1]国网河南省电力公司电力科学研究院,郑州450052 [2]国网河南省电力公司,郑州450052 [3]天津天大求实电力新技术股份有限公司,天津300384

出　　处：《电测与仪表》2015年第4期42-46,共5页Electrical Measurement & Instrumentation

摘　　要：文章针对光储微网接入配电网系统可靠性问题进行研究,从光储微网的特点入手,分析光储微网接入位置和运行方式对配电网的影响,并建立基于最小回路法的含光储微网的配电网可靠性评估模型,在典型网架结构基础上进行验证。研究表明,光储微网在理论分析上可提升线路节点电压,降低网损,并在一定条件下提升系统的可靠性,该评估模型能够对实际光储微网接入的配电网进行可靠性评估,为光储微网的大量接入和可靠性提升提供指导。The paper addresses the reliability issues of the power system with the access of photovoltaic-battery micro grid.Started from the characteristics of photovoltaic-battery micro grid, the effect of the location and operation mode of the micro grid on the distribution network is analyzed.The reliability evaluation model of the distribution network including photovoltaic-battery micro grid is established based on minimum circuit method, and the method is verified at the basis of typical system structure.It shows that the photovoltaic-battery micro grid can increase line voltage, re-duce network loss, and effectively improve the reliability of the system.The model can be used to evaluate the relia-bility of actual distribution network with the access of photovoltaic-battery micro grid, and can provide guidance for large amount of photovoltaic-battery micro grid access and reliability improvement.

关 键 词：光储微网 配电网可靠性 评估模型 最小回路法 

分 类 号：TM71[电气工程—电力系统及自动化]