基于果品介电特性的无损检测技术研究综述  

Review of Fruit Nondestructive Testing Technology Research Based on the Dielectric Characteristics

作　　者：周世平[1] 张海红[1] 李海峰[1] 马奇虎 

机构地区：[1]宁夏大学农学院,宁夏银川750021

出　　处：《食品研究与开发》2015年第1期131-134,144,共5页Food Research and Development

基　　金：国家科技支撑项目(2012BAF07B00);国家自然科学基金(31160346)

摘　　要：无损检测技术已成为果品品质检测的趋势。本文对基于介电特性的果品无损检测最新研究进行了综述,比较了常用测试技术及条件,分析了影响果品介电特性参数的频率、温度、贮藏时间等外界因素,比较了果品的成熟度、硬度、成分等内在因素对果品电参数的影响,并且指出了该领域的研究动向,为今后该技术的进一步的研究应用提供了借鉴。Nondestructive testing technology has become the developing trend of fruit quality detection. The latest research progresses on fruit nondestructive testing based on the dielectric properties were reviewed in this paper. The commonly used testing technologies and their conditions were compared. The external factors , such as frequency, temperature, storage time etc., which influence fruit dielectric properties, were analyzed. The internal factors such as fruit ripeness, hardness, composition and so on, which influence fruit dielectric properties were compared. The research trends in this field were described and could provide the reference for the further research and application in the future.

关 键 词：果品 介电特性 无损检测 

分 类 号：TS255.7[轻工技术与工程—农产品加工及贮藏工程]