微波暗室反射率电平自动校准方法及测量不确定度  

Auto Calibration and Measurement Uncertainty of Quiet Zone Reflectivity Level of Microwave Anechoic Chambers

作　　者：张恒萍[1] 朱传焕[1] 唐君[1] 

机构地区：[1]中国船舶重工集团公司第七一研究所,湖北武汉430064

出　　处：《计测技术》2015年第1期38-41,共4页Metrology & Measurement Technology

基　　金：国家"十一五"技术基础科研项目(J082008B001)

摘　　要：通过开展1-40 GHz微波暗室性能自动校准技术研究,研制了低反射8维度空间测试支架,降低了测试装置微波干扰;开发了基于Labview 8.6环境的测试系统控制软件,实现信号调整和收发天线的相对运动;本文就微波暗室自动校准系统静区反射率电平测量不确定度进行了分析和评定。A 1-40 GHz auto-calibration technique was developed for microwave anechoic chambers,and an octuple space motion frame with low reflection was developed to reduce disturbing microwave signals. The control software of the test system is based on Labview 8. 6 and it can realize signal modulation and antennas relative movement. Analysis and evaluation was made on the measurement uncertainty of the quiet zone reflectivity level in the microwave anechoic chamber.

关 键 词：微波暗室 自动校准 反射率电平 不确定度 

分 类 号：TB97[一般工业技术—计量学] TM937[机械工程—测试计量技术及仪器]