A New Method for Measurements of the Poloidal Rotation Velocities and Wavelength Calibration of X-ray Imaging Crystal Spectrometer in Magnetic Fusion Devices  

作　　者：石跃江 吕波 王福地 M.BITTER K.W.HILL 叶民友 

机构地区：[1]University of Science and Technology of China [2]Institute of Plasma Physics,Chinese Academy of Sciences [3]Princeton Plasma Physics Laboratory,Princeton,New Jersey 08543,USA

出　　处：《Plasma Science and Technology》2015年第4期265-267,共3页等离子体科学和技术（英文版）

基　　金：supported by National Natural Science Foundation of China(Nos.11175208,11305212 and 11405212);the National Magnetic Confinement Fusion Science Program of China(No.2013GB112004);JSPS-NRF-NSFC A3 Foresight Program in the Field of Plasma Physics(No.11261140328)

摘　　要：A new simple method is presented for the wavelength calibration and measurement of poloidal rotation velocities with X-ray imaging crystal spectrometer（XICS）in magnetic fusion devices.In this method,the toroidal rotation of plasma is applied for high precise alignment and wavelength calibration of the poloidal XICS.The measurement threshold of poloidal rotation velocity can be lowered to 1-3 km/s with this method.A new simple method is presented for the wavelength calibration and measurement of poloidal rotation velocities with X-ray imaging crystal spectrometer（XICS）in magnetic fusion devices.In this method,the toroidal rotation of plasma is applied for high precise alignment and wavelength calibration of the poloidal XICS.The measurement threshold of poloidal rotation velocity can be lowered to 1-3 km/s with this method.

关 键 词：X-ray imaging crystal spectrometer wavelength calibration poloidal rotation velocity 

分 类 号：TH744.1[机械工程—光学工程]