动态光散射及电子显微镜纳米颗粒测量方法的比较研究  

Comparison Study on DLS and SEM Methods of Measuring Nanoparticle Size

作　　者：陈哲敏[1] 胡朋兵[1] 孟庆强[1,2] 

机构地区：[1]浙江省计量科学研究院,杭州310013 [2]中国计量学院光学与电子科技学院,杭州310018

出　　处：《光散射学报》2015年第1期54-58,共5页The Journal of Light Scattering

基　　金：浙江省科技厅重大专项(2012C13010-1);国家自然科学基金(61203205)

摘　　要：本文以聚苯乙烯纳米颗粒作为测量对象,分别采用最为常见的扫描电子显微镜法(SEM)和动态光散射法(DLS)测量其粒径。结果表明:电子显微镜法可观察颗粒形貌及结构,但测量误差偏大;动态光散射法可精确测量颗粒粒径及其分布状态。分析讨论了这两种测量方法的优缺点,对纳米颗粒测量具有重要的指导作用。In this paper,we measured the size of the polystyrene nanoparticle by using the most common methods：scanning electron microscopy（SEM）and dynamic light scattering（DLS）.Experimental results showed the particle morphology and structure could be observed with SEM method,but the corresponding measuring error was relatively large;while the DLS method could accurately measure the nanoparticle size and its distribution.The advantages and disadvantages of the two measurement methods were discussed,which has an important directing role of nanoparticle measurement.

关 键 词：纳米测量 扫描电子显微镜 动态光散射 

分 类 号：O436.2[机械工程—光学工程]