基于发光二极管的快响应多靶机炸点测试方法  

Multi Burst Point Fast Response Testing Based on Light Emitting Diode

作　　者：王刚[1] 黄勇[1] 苏辉[1] 张喜文[1] 牛燕婷 

机构地区：[1]西安机电信息技术研究所,陕西西安710065

出　　处：《探测与控制学报》2015年第1期72-75,共4页Journal of Detection & Control

摘　　要：针对近炸引信高速弹目交会模拟试验中,采用普通氙灯进行引信和靶机交会时炸点指示存在充电时间长,不适应多靶机测试的问题,提出了一种基于发光二极管的快响应多靶机炸点测试方法。该方法采用高速光藕、高速MOSFET、高速功率切换开关等高速器件驱动大功率LED组进行起爆信号的指示;结合位标和高速摄像计算炸点位置和瞬时速度。经测试和试验,成功获得了有效的数据,大功率LED炸点指示模块的响应时间仅为1μs,具有较大实用价值。During high speed missile-target encounter test,it is a problem that the charging time is too long for the ordinary xenon lamp as a pilot lamp,which is not suited to test multi targets.To solve the problem,a fast response method was put forward for testing multi targets based on light emitting diode.High speed devices were used to drive high power LEDs,including high speed optical-couples,high speed MOSFETs and high speed power switches.Then,it was used as a signal to point out the position where laser-proximity fuze fire.It was easy to obtain information of position and instantaneous velocity by calculation,combined with a high speed camera and positional label.The method was testified successfully to obtain effective data in test.

关 键 词：激光引信 大功率发光二极管 多靶机 炸点测试 

分 类 号：TJ06[兵器科学与技术—兵器发射理论与技术]