已知晶体电子衍射指标化中的实际问题  

Indexing methods on the electron diffraction pattern of the known crystal

作　　者：施洪龙[1] 雒敏婷[2] 王文忠[1] 

机构地区：[1]中央民族大学理学院 [2]中国科学院过程工程研究所,北京100081

出　　处：《电子显微学报》2015年第1期25-32,共8页Journal of Chinese Electron Microscopy Society

基　　金：北京高等学校青年英才计划项目(No.YETP1297);中央高校基本科研业务费专项资金资助(No.2014MDLXYQN09);北京市大学生科学研究与创业行动计划(No.BEIJ2014110004);中央民族大学本科生研究训练计划(No.URTP2014110037)

摘　　要：电子衍射是晶体结构分析最为常用的实验技术之一,电子衍射花样能直接反映晶体倒易点阵的特征。但利用传统方法对电子衍射花样进行指标化相当耗时、繁杂。为此,本文基于一些常用软件和DM插件对指标化过程中衍射点间距的测量、晶面间距的计算和米勒指数的指认等环节进行实例分析,对指标化过程中的一些常见问题进行可行性讨论,以期实现更为便捷的衍射分析。Electron diffraction is one of the basic structure analysis techniques, and indexing of the zone axis pattern recorded by films or CCD is a fundamental ability for the electron microscope operators. However, the pattern indexing using the traditional method should be followed by the measuring the distance between diffraction spots and the transmitted spot, calculation the d-spacing of these planes, setting {hkl} indices to them, and calculating the zone axis direction, which is obviously rather tedious and time-consuming. In this paper, we discussed all of the possible methods to improve the indexing procedure by the common used software and DM plugins.

关 键 词：电子衍射 指标化 衍射分析 

分 类 号：O766.4[理学—晶体学]