一种嵌入式软件逻辑覆盖测试方法研究  

A Logic Coverage Test Method Research for Embedded Software

作　　者：肖永健[1] 刘永恒[1] 徐军[1] 

机构地区：[1]工业和信息化部电子第五研究所,广州510610

出　　处：《计算机测量与控制》2015年第4期1080-1083,共4页Computer Measurement &Control

摘　　要：针对嵌入式软件测试覆盖率低的问题,提出了基于软件故障注入的逻辑覆盖测试方法,首先就嵌入式系统常用传感器建立故障模式库,设计了嵌入式软件故障注入系统;其次选取中间层作为故障注入点,研究基于VxWorks653嵌入式操作系统的故障注入实现方式,并通过分析故障信号在软件系统中的传播,提出优化测试用例的方法;最后通过实验验证了该方法可有效提高容错设计功能、冗余设计功能、故障检测功能测试的逻辑覆盖率;有助于提高嵌入式软件的可靠性。In order to solve the low rate logic coverage on embedded software, tb.is paper based on the software fault injection technique puts forward the logic coverage testing method. Firstly, the fault mode library for commonly used sensors of the embedded system was established, and then the embedded software fault injection system was designed. Secondly, intermediate layer was chosen as the fault injection point, and the realization of fault injection for VxWorks653 embedded operating system was studied. Through analyzing the propagation of fault signal in software system, an optimization method of fault injection ease was present. Finally, an experiment verified that this method can improve the logic coverage rate for the functions of fault-tolerant design, redundancy design and fault detection. This method is also helpful to improve the reliability of the embedded software.

关 键 词：嵌入式软件 故障注入 逻辑覆盖 故障信号传播 

分 类 号：TP336[自动化与计算机技术—计算机系统结构]