非鲁棒路径时滞故障测试生成算法(英文)  

A new test generation algorithm for non-robust path delay faults

作　　者：赵莹[1] 赵谢秋[1] 李艳娟[2] 

机构地区：[1]北华大学电气信息工程学院,吉林132021 [2]东北林业大学信息与计算机工程学院,哈尔滨150040

出　　处：《机床与液压》2015年第6期54-58,共5页Machine Tool & Hydraulics

基　　金：supported by the National Natural Science Foundation of China (Study on higher-order logic based inductive logic programming learning algorithm and its application,61300098);Jilin City Technology Bureau Foundation (Intelligent control system of Warehousing Logistics,201414006)

摘　　要：针对数字电路中非鲁棒路径时滞故障测试时间长、故障覆盖率较低的问题,提出了人工蜂群优化的测试生成算法。该算法首先应用电路转换法则把数字电路转换成为其等效电路,然后用Hopfield神经网络构建等效电路单固定故障的约束电路,并得到能量函数;再应用人工蜂群优化算法计算能量函数的最小值以得到等效电路单固定故障的测试矢量,最后根据对应关系得到原电路非鲁棒路径时滞故障的测试矢量对。在ISCAS’85国际标准电路上的实验结果表明:该算法故障覆盖率能够达到98%,并且平均测试生成时间小于0.8 s。A new test generation algorithm based on neural network and artificial bee colony optimization for non- robust path delay faults is proposed in this paper because the traditional test generation algorithm＇ s efficiency is low. The algorithm switches digital circuit into equivalent partial leaf-dag circuit firstly and then constructs the constraint circuit for the equivalent circuit. Hopfield neural network model is constructed for the constraint circuit and energy function is obtained. The test vector for the single stuck-at fault of equivalent circuit can be obtained by using artificial bee colony optimization algorithm to solve the minimum of energy function, then the test vector is changed to the test vector pairs for the non-robust path delay fault of original digital circuit. The experiment re- suits demonstrate that the algorithm＇ s fault coverage algorithm can achieve 98%, average test generation time is less than 0.8 seconds,

关 键 词：测试生成 非鲁棒路径时滞故障 HOPFIELD神经网络 人工蜂群算法 

分 类 号：TN407[电子电信—微电子学与固体电子学]