智能卡去激活测试问题分析与解决方法  

Analysis and Solution of Smart Card Deactivation Test Failure

作　　者：周代卫 张沛 周宇 孙向前 

机构地区：[1]中国信息通信研究院泰尔终端实验室 [2]中国信息通信研究院泰尔终端实验室国际认证部

出　　处：《电信网技术》2015年第3期69-74,共6页Telecommunications Network Technology

摘　　要：针对移动通信终端设备检测认证中常见的一类智能卡去激活测试失败问题,通过借助专用测试工具实际比对和验证,深入分析并定位了问题原因,进一步提出了一种通过软件控制的分段降压法。该方法通过了实际验证,并且具有不改动硬件设计,同时不影响其他一致性测项的优点。Based on a class of common failure issue during SIM/UICC deactivation testing of mobile terminals,a dedicate testing tool and measurement method are used to analyze the fail logs and to compare the possible factors. This paper locates the root cause of the problem through in-depth analysis, and further proposes a software-controlled powerdrop method by two stages. With actual verification result, this method does not impact the hardware design and achives the advantage of consistent conformance testing.

关 键 词：智能卡 机卡接口 去激活 逻辑电位 

分 类 号：TN929.5[电子电信—通信与信息系统]