基于馈通电压自动补偿的OLED电性能测试波形设计研究  

Design of OLED shorting bar testing waveform based on feed through voltage compensation principle

作　　者：刘志军[1] 侯红兵 李金泰[1] 詹家豪[1] 

机构地区：[1]广州航海学院船舶工程系,广东广州510725 [2]惠州市仲恺高新技术投资控股有限公司,广东惠州516006

出　　处：《液晶与显示》2015年第2期296-299,共4页Chinese Journal of Liquid Crystals and Displays

基　　金：2014年广东省教育厅科技创新项目(No.2013KJCX0195);广东省现代信息服务业发展专项资金项目(No.GDEID2011IS061)

摘　　要：常规馈通电压计算原理涉及到OLED体的电容值,不同型号OLED产品电容值是个变量,为了得到最佳的电容值,OLED制造企业测试部门需做大量的验证实验。本文直接通过栅极电压上拉使OLED体的储存电容产生馈通电压来补偿栅极电压关闭时栅极和漏极之间寄生电容产生的馈通电压,无需测量OLED体的电容值和修正Vcom值即可补偿栅极电压关闭时栅极和漏极之间的寄生电容产生的馈通电压。实验结果表明,基于馈通电压自动补偿原理设计的Shorting Bar Test Waveform与Vcom人工修正原理设计的电性能测试波形的检测效果一致,而对不同缺陷的检测率有微小差异。The conventional calculation principle for the feed through voltage relates to capacitance values of OLED body,and capacitance values of different OLED products is variable.A lot of experiments must be done by testing department of OLED manufacturing enterprise in order to get the best capacitance values of OLED body.This paper directly pulls up gate voltage,and then the storage capacitor of OLED body produces a feed through voltage to compensate the feed through voltage generated by the parasitic capacitance between the gate and the drain as the gate voltage closing.Experiment result shows that the total detection rate using the testing waveform based on automatic compensation principle or conventional compensation is consistent,and there is little difference on the detection rate of different defects.

关 键 词：OLED 电性能测试 波形测试 电压补偿 

分 类 号：TN321.5[电子电信—物理电子学]