基于马尔科夫过程的半导体激光器空间辐射可靠性分析  

Study on Reliability of Space Irradiation of Laser Diodes Based on Markov Process

作　　者：周义建[1] 陈校平[1] 曲光 朱子行[1] 

机构地区：[1]空军工程大学信息与导航学院,西安710077 [2]空军大连通信士官学校,辽宁大连116600

出　　处：《半导体光电》2015年第1期24-27,33,共5页Semiconductor Optoelectronics

摘　　要：通过对半导体激光器辐射效应的分析,得到了器件在空间环境中的损伤规律和退火规律。根据辐射效应的特点,将器件的性能退化表示为泊松过程与指数过程的结合,建立了基于马尔科夫过程的可靠性模型,利用一步概率转移矩阵获得了故障概率分布函数、可靠度函数以及平均故障前时间的计算方式。根据已有数据,对半导体激光器在空间辐射环境中的性能退化过程进行了仿真,得到了总测试时间为100 000h时器件的故障概率分布曲线,计算得出平均故障前时间约为42 758.9h,此时器件可靠度为0.451。分析了不同时间条件下器件的状态概率分布律,结果符合器件性能退化的一般规律,能够描述出器件的失效过程。By analyzing the radiation mechanism of laser diodes, the performance degradation and annealing effect in space environment was achieved. According to the characteristic of radiation effect, the degradation process was expressed as the combination of Poisson process and exponential process, and the Markov-process-based reliability model was established. Expressions of cumulative distribution function, reliability function and mean time to failure were derivated using one-step transition probability matrix. Based on the existing data, degradation process was simulated, cumulative distribution curve within 100 000 h was given. It is concluded that the mean time to failure of the device is about 42 758.9 h with the reliability of 0. 451. The distribution law of the device states under different time conditions was analyzed, and it is shown that the results accord with the common degradation law and can describe the degradation process perfectly.

关 键 词：半导体激光器 可靠性模型 马尔科夫过程 空间辐射效应 泊松过程 指数过程 

分 类 号：TN248.4[电子电信—物理电子学]