基于TEM小室的探头校准系统不确定度评定  

The Uncertainty Estimation for the Probe Calibration Results Employing a TEM Cell

作　　者：刘潇[1] 李渤[1] 谢鸣[1] 

机构地区：[1]中国计量科学研究院

出　　处：《计量学报》2015年第3期318-323,共6页Acta Metrologica Sinica

基　　金：科技部国家国际科技合作专项(2013DFA70570)

摘　　要：TEM小室是一个常用的电磁场发生装置，使用TEM小室组建场强探头校准系统，可以对射频电磁场探头进行校准。针对一套300kHz-100MHz频段的场强探头校准系统进行分析，以磁场探头为例，给出该频段范围内5个频点校准的不确定度评定结果。该不确定度分析过程考虑了TEM小室内空间波阻抗，以及探头与小室内标准场之间的相互作用等，对于分析电磁场探头的校准过程具有参考意义。The TEM cell is used widely as an electromagnetic field generator, and by employing it, a probe calibration system can be set up to calibrate the radio frequency electromagnetic field probe. A probe calibration system working at 300 kHz - 100 MHz is analyzed, and the measurement result uncertainty is presented for a magnetic field probe at five different frequencies in that range. The analysis takes into account the effect of the wave impedance inside the TEM cell, and that of the interaction between the probe and the standard field ere, which can be a useful guide to analyse the electromagnetic field probe calibration process.

关 键 词：计量学 TEM小室 电磁场探头 校准系统 测量不确定度 

分 类 号：TB973[一般工业技术—计量学]