CdZnTe衬底沉积相成分分析  

Studies of Precipitates in the CdZnTe Crystal

作　　者：张鹏举[1] 孔金丞[1] 胡赞东[1] 赵俊[1] 赵增林[1] 万锐敏[1] 王羽[1] 王京云[1] 姬荣斌[1] 

机构地区：[1]昆明物理研究所,云南昆明650223

出　　处：《红外技术》2015年第4期323-326,共4页Infrared Technology

摘　　要：采用扫描电子显微镜技术对Cd Zn Te单晶片中的沉积相进行成分分析研究,结果表明通过红外显微系统观察到的Cd Zn Te晶片中常见的"放射状"沉积相和"链状"沉积相Cd含量富集,确认为Cd沉积相;另外,扫描电镜能谱仪对沉积相颗粒分析表明,Cd Zn Te晶体中的杂质元素易在Cd沉积相中富集。Precipitates in the CdZnTe crystal were studied by SEM technology. It is found that radial-type and chain-type precipitates were also Cd precipitates. Cd precipitates components analysis by energy dispersive X-ray detector show that the impurities in CdZnTe crystal were concentrated in the Cd precipitates.

关 键 词：CDZNTE Cd沉积相 扫描电子显微镜 

分 类 号：TN304[电子电信—物理电子学]