On-wafer de-embedding techniques from 0.1 to 110 GHz  

On-wafer de-embedding techniques from 0.1 to 110 GHz

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作  者:汤国平 姚鸿飞 马晓华 金智 刘新宇 

机构地区:[1]School of Advanced Materials and Nanotechnology,Key Laboratory of Wide Band-Gap Semiconductor Materials and Devices,Xidian University [2]Institute of Microelectronics,Chinese Academy of Sciences

出  处:《Journal of Semiconductors》2015年第5期72-80,共9页半导体学报(英文版)

基  金:Project supported by the National Natural Science Foundation of China(No.61401457)

摘  要:On-wafer S-parameter de-embedding techniques from 0.1 to 110 GHz are researched. The solving re- suits of thru-reflect-line (TRL) and line-reflect-match (LRM) de-embedding algorithms, when the input and output ports are asymmetric, are given. The de-embedding standards of TRL and LRM are designed on an InP substrate. The validity of the de-embedding results is demonstrated through two passive components, and the accuracy of TRL and LRM de-embedding techniques is compared from 0.1 to 110 GHz. By utilizing an LRM technique in 0.1- 40 GHz and a TRL technique in 75-110 GHz, the intrinsic S-parameters of active device HBT in two frequency bands are obtained, and comparisons of the extracted small-signal current gain and the unilateral power gain before and after de-embedding are presented. The whole S-parameters of actual DUT from 0.1 to 110 GHz can be obtained by interpolation.On-wafer S-parameter de-embedding techniques from 0.1 to 110 GHz are researched. The solving re- suits of thru-reflect-line (TRL) and line-reflect-match (LRM) de-embedding algorithms, when the input and output ports are asymmetric, are given. The de-embedding standards of TRL and LRM are designed on an InP substrate. The validity of the de-embedding results is demonstrated through two passive components, and the accuracy of TRL and LRM de-embedding techniques is compared from 0.1 to 110 GHz. By utilizing an LRM technique in 0.1- 40 GHz and a TRL technique in 75-110 GHz, the intrinsic S-parameters of active device HBT in two frequency bands are obtained, and comparisons of the extracted small-signal current gain and the unilateral power gain before and after de-embedding are presented. The whole S-parameters of actual DUT from 0.1 to 110 GHz can be obtained by interpolation.

关 键 词:model MILLIMETER-WAVE de-embed TRL LRM 

分 类 号:TN303[电子电信—物理电子学]

 

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