透射电子显微镜三维重构技术及其在材料研究领域的应用  

Introduction to electron microscopy 3D reconstruction and its application in materials science

作　　者：唐明华[1] 郭军[1] 陈木子[1] 

机构地区：[1]苏州大学分析测试中心,江苏苏州215123

出　　处：《电子显微学报》2015年第2期142-148,共7页Journal of Chinese Electron Microscopy Society

基　　金：实验室安全及设备管理教改项目-图像重构技术(No.58333007)

摘　　要：透射电子显微镜(TEM)三维重构技术是一种基于TEM用以表征材料三维空间结构的分析测试技术。本文对TEM三维重构技术进行简要介绍,并以Tecnai G2F20场发射透射电镜三维重构为例介绍了实际操作过程中的经验及其在纳米、半导体等材料研究领域的应用。Electron microscopy 3D reconstruction is a well-established technique based on transmission electron microscopy to recover the three-dimensional structure of an object from a series of projection images at different viewing angles. A brief introduction to electron microscopy 3D reconstruction was illuminated in this paper. As an example, some practical experiences in electron microscopy 3D reconstruction with transmission electron microscope （ Tecnai G2 F20 ） for nano materials and semiconductor materials were introduced.

关 键 词：三维重构 透射电镜 

分 类 号：TB302[一般工业技术—材料科学与工程]