介观LC电路中电容、电感和外源流突变所产生的量子压缩  

Quantum squeezing caused by abrupt change of capacity,inductance and external current source in quantized mesoscopic LC electric circuit

作　　者：吴卫锋[1] 范洪义[2] 

机构地区：[1]池州学院机械与电子工程系,安徽池州247000 [2]中国科学技术大学材料科学与工程系,安徽合肥230026

出　　处：《量子电子学报》2015年第3期335-340,共6页Chinese Journal of Quantum Electronics

基　　金：安徽省青年自然科学基金(1308085QA18);安徽省池州学院研究中心项目(XKY201424)

摘　　要：通过采用有序算符内的积分技术(IWOP技术),对介观LC电路量子化方案所得到的哈密顿量进行了分析,探讨了该方案下LC电路电容、电感、外源流在突变时所产生的量子压缩效应。结果标明:电容突变反映在正交组q呈现压缩效应;电感突变反映在另一正交相p呈现压缩效应;而外源流的非线性突变反映出来的是数-相压缩。The technique of integration within ordered product （IWOP） of operator is applied to analyze the Hamiltonian produced in the quantization scheme of the mesosopic LC electric circuit and explore the corresponding quantum squeezing effects when there is a sudden change in electrical capacity, inductance and external current. It turns out that while the sudden change of capacity results in squezzing in the quadrature q, the sudden change of inductance brings out squeezing in another quadrature p, and the nonlinear change of enternal current source reveals number-phase squeezing.

关 键 词：量子光学 介观LC电路 数-相量子化 量子压缩 

分 类 号：O431.2[机械工程—光学工程]