Experimental research on the feature of an x-ray Talbot–Lau interferometer versus tube accelerating voltage  

作　　者：王圣浩 Margie P.Olbinado Atsushi Momose 韩华杰 胡仁芳 王志立 高昆 张凯 朱佩平 吴自玉 

机构地区：[1]National Synchrotron Radiation Laboratory,University of Science and Technology of China [2]Institute of Multidisciplinary Research for Advanced Materials,Tohoku University [3]Institute of High Energy Physics,Chinese Academy of Sciences

出　　处：《Chinese Physics B》2015年第6期673-678,共6页中国物理B（英文版）

基　　金：Project supported by the Major State Basic Research Development Program of China(Grant No.2012CB825800);the Science Fund for Creative Research Groups,China(Grant No.11321503);the National Natural Science Foundation of China(Grant Nos.11179004,10979055,11205189,and 11205157);the Japan–Asia Youth Exchange Program in Science(SAKURA Exchange Program in Science)Administered by the Japan Science and Technology Agency

摘　　要：X-ray Talbot-Lau interferometer has been used most widely to perform x-ray phase-contrast imaging with a con- ventional low-brilliance x-ray source, and it yields high-sensitivity phase and dark-field images of samples producing low absorption contrast, thus beating tremendous potential for future clinical diagnosis. In this work, by changing the accel- erating voltage of the x-ray tube from 35 kV to 45 kV, x-ray phase-contrast imaging of a test sample is performed at each integer value of the accelerating voltage to investigate the characteristic of an x-ray Talbot-Lau interferometer （located in the Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Japan） versus tube voltage. Ex- perimental results and data analysis show that within a range this x-ray Talbot-Lau interferometer is not sensitive to the accelerating voltage of the tube with a constant fringe visibility of ~ 44%. This x-ray Talbot-Lau interferometer research demonstrates the feasibility of a new dual energy phase-contrast x-ray imaging strategy and the possibility to collect a refraction spectrum.X-ray Talbot-Lau interferometer has been used most widely to perform x-ray phase-contrast imaging with a con- ventional low-brilliance x-ray source, and it yields high-sensitivity phase and dark-field images of samples producing low absorption contrast, thus beating tremendous potential for future clinical diagnosis. In this work, by changing the accel- erating voltage of the x-ray tube from 35 kV to 45 kV, x-ray phase-contrast imaging of a test sample is performed at each integer value of the accelerating voltage to investigate the characteristic of an x-ray Talbot-Lau interferometer （located in the Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Japan） versus tube voltage. Ex- perimental results and data analysis show that within a range this x-ray Talbot-Lau interferometer is not sensitive to the accelerating voltage of the tube with a constant fringe visibility of ~ 44%. This x-ray Talbot-Lau interferometer research demonstrates the feasibility of a new dual energy phase-contrast x-ray imaging strategy and the possibility to collect a refraction spectrum.

关 键 词：x-ray Talbot-Lau interferometer x-ray imaging PHASE-CONTRAST tube accelerating voltage x-ray tube 

分 类 号：O434.1[机械工程—光学工程]