软X射线双频光栅干涉诊断等离子体  

Plasma interference diagnosis by soft X-ray double frequency gratings

作　　者：王琛[1] 安红海[1] 刘正坤[2] 王伟[1] 方智恒[1] 贾果[1] 熊俊[1] 乔秀梅[3] 付绍军[2] 郑无敌[3] 王世绩[1] 

机构地区：[1]中国工程物理研究院上海激光等离子体研究所,上海201800 [2]中国科学技术大学国家同步辐射实验室,合肥230029 [3]北京应用物理与计算数学研究所,北京100094

出　　处：《强激光与粒子束》2015年第6期130-135,共6页High Power Laser and Particle Beams

基　　金：国家自然科学基金项目(10975135;11075146)

摘　　要：针对高温稠密激光等离子体临界密度附近电子密度的诊断需求,发展了基于软X射线激光的软X射线双频光栅干涉诊断技术。利用波长13.9nm的类镍银软X射线激光作为探针,掠入射式的双频光栅作为分光干涉元件,对激光辐照金平面靶产生的等离子体进行诊断尝试。实验获得了清晰的干涉条纹图像,充分表明该技术的实用性。但结果中存在靶面不清晰等问题,为此,提出了初步的解决方案。To probe the electron density distribution of the plasma, double-frequency grating shearing interferometry based on the soft X-ray laser technology is developed. The 13.9 nm Ni-like Ag soft X-ray laser is used as a probe to make attempt on the diagnosis of laser produced plasma from a planar gold wafer target. Clear interference fringes image is achieved, which fully demonstrates the practieahility of this technology. However, there are some problems such as the unclear target surface in the im- age. Analysis indicates the main reasons of these problems and a reasonable solution is proposed to improve this technology.

关 键 词：等离子体诊断 干涉技术 软X射线激光 

分 类 号：O53[理学—等离子体物理]