某型脉冲行波管的可靠性增长研究  

Research on Reliability Enhancement of a Traveling Wave Tube

作　　者：杨建民[1] 季大习[2] 

机构地区：[1]海军驻南京地区航空军事代表室,江苏南京210002 [2]国营第七七二厂,江苏南京211800

出　　处：《真空电子技术》2015年第2期86-88,共3页Vacuum Electronics

摘　　要：本文针对某型脉冲行波管应用中的问题和新的需求,介绍了有关可靠性提升的研究工作。通过改进电子源性能、强化过程控制,优化结构设计等多方面举措并结合整管老炼及早期筛选,提高了整管的可靠性,降低了早期失效率。Aiming at the application problems and new requirements of a pulse travelling wave tube （TWT）, research on reliability enhancement was carried out. Through improving the electron source performance, strengthening the process control, optimizing the structure design, and combining tube aging and early screening, the reliability of the whole tube was enhanced and the early failure rate was decreased.

关 键 词：可靠性提升 行波管 

分 类 号：TN124[电子电信—物理电子学]