基于X光微点源的半影成像技术  

Penumbral imaging technique based on the microfocus X-ray source

作　　者：余波[1] 苏明[1] 晏骥[1] 蒲昱东[1] 蒋炜[1] 陈伯伦[1] 黄天晅[1] 

机构地区：[1]中国工程物理研究院激光聚变研究中心,四川绵阳621900

出　　处：《强激光与粒子束》2015年第7期105-108,共4页High Power Laser and Particle Beams

基　　金：国家自然科学基金项目(11205142)

摘　　要：基于X光微点源装置,从实验角度验证了半影成像的原理。利用针孔成像,直接测量了微点源源区图像;给出了半影孔成像、半影锥成像和环孔成像原理,以及在微点源的半影成像结果和维纳滤波重建结果。从实验结果可知:半影锥成像具有与半影孔成像相同的诊断能力,两种方法的重建图像尺寸与源尺寸一致;环孔成像的诊断能力更好,重建图像的尺寸和形状更接近源图像。The principle of penumbral imaging is experimentally validated based on the microfocus X ray source. Using pin hole imaging, the microfocus source is directly measured; then the basic principles of penumbral hole imaging, penumbral cone imaging and penumbral ring imaging are introduced, as well as the penumbral imaging results on the microfocus sources and Wie ner filtering reconstruction results. According to the results, the diagnostic capability of penumbral cone is the same with penum bral hole imaging, the size of the reconstruction image agrees with that of the source image, and the diagnostic capability of pe numbral ring imaging is better, the size and shape of the reconstruction image are closer to that of the source image.

关 键 词：微点源 半影成像 编码装置 

分 类 号：O571.53[理学—粒子物理与原子核物理]