一种简便的原位测定红树叶片表面菲的荧光分析方法  

A Simple in situ Fluorimetry for Determination of Phenanthrene Adsorbed on Mangrove Leaf Surface

作　　者：李锐龙[1] 朱亚先[2] 张勇[1,3] 

机构地区：[1]厦门大学环境科学研究中心,近海海洋环境科学国家重点实验室,厦门361005 [2]厦门大学化学化工学院,厦门361005 [3]漳州职业技术学院,漳州363000

出　　处：《分析化学》2015年第6期914-918,共5页Chinese Journal of Analytical Chemistry

基　　金：国家自然科学基金(No.21177102);教育部博士点基金(No.20130121130005);厦门大学基础创新科研基金;中央高校基本科研业务费专项资金(No.2013121052)资助项目~~

摘　　要：采用自行设计的多用途荧光比色皿,建立了一种秋茄（Kandelia obovata,Ko）,桐花树（Aegiceras corniculatum,Ac）和白骨壤（Avicennia marina,Am）叶片表面菲（Phenanthrene,Phen）简便的原位测定方法,本方法测定Ko,Ac和Am表面Phen的线性范围分别为6.5~1200 ng/spot,18.5~600 ng/spot和3.2~700 ng/spot,检出限分别为0.6,0.7和1.3 ng/spot,加标回收率分别为92.4%~101.0%、94.8%~108.2%和93.8%~103.6%,相对标准偏差小于6.5%。本方法的检出限和相对标准偏差均优于固体表面光纤荧光法（Solid surface optical fiber fluorimetry,SSF）,线性范围与SSF法处于同一数量级。本方法与SSF法测得的红树叶片表面Phen的浓度并无显著差异（p〉0.05）,但本方法极大地简化了操作,提高了重现性。A self-designed multipurpose fluorescence colorimetric cell was employed to establish a simple in situ method for the determination of phenanthrene （Phen） adsorbed on leaf surfaces of Kandelia obovata （K o）, Aegiceras corniculatum （Ac） and Avicennia marina （Am）. The linear dynamic ranges for the determination of phenanthrene （Phen） on Ko, Ac and Am leaf surfaces were 6.5- 1200 ng/spot, 18.5- 600 rig/spot and 3.2-700 ng/spot, with the detection limits of 0.6, 0.7 and 1.3 ng/spot, respectively. The recoveries of standard addition for Phen on Ko, Ac and Am leaf surfaces were 92.4% -101.0%, 94.8% - 108.2 % and 93.8% -103.6%, respectively. The relatively standard deviations were less than 6.5%. The detection limit and RSD of the established method were superior to solid surface optical fiber fluorimetry （SSF） while the linear range of these two methods were in the same order of magnitude. There was no significantly difference （p〉0.05） between the concentrations of Phen on mangrove leaf determined by SSF and the established method. Besides, the established method had the advantages such as simplified experimental operations and good repeatability.

关 键 词：菲 红树叶 原位 荧光分析 

分 类 号：X835[环境科学与工程—环境工程] O657.3[理学—分析化学]