湿热环境对PbS光导探测器可靠性影响  

Reliability of PbS Photoconductive Detector in Hydrothermal Environment

作　　者：陈凤金[1] 司俊杰[1,2] 施正风[1] 

机构地区：[1]中国空空导弹研究院,河南洛阳471009 [2]红外探测器技术航空科技重点实验室,河南洛阳471009

出　　处：《红外技术》2015年第6期510-513,共4页Infrared Technology

摘　　要：叙述了PbS薄膜的化学水浴制备方法及PbS薄膜形貌、性能测试及湿热环境(相对湿度95%)试验的过程,阐述了PbS探测器芯片经湿热环境试验后暗阻等性能参数的变化情况,分析了其原因和相关机理。短时间(1 h)内湿热环境下,其性能参数变化在5%以内,在持续24 h的潮湿环境后,PbS的暗阻增大50%以上。在之后的2×24 h、3×24 h、4×24 h、5×24 h湿热环境下,暗阻值增量随时间递增呈正比例关系。当潮湿试验进行到7×24 h后,部分试验样件无法测试出响应信号,样件失效。The PbS films have been prepared by CMD, and the surface morphology of which is showed, performance and experiment in hydrothermal environment （50± 2℃, relative humidity≥95%） are specified. The performances of PbS photoconductive detectors in hydrothermal environment are analysed, which have not been influenced in hydrothermal environment for 1 h. The Rd has increased by 50% in hydrothermal environment for 24 h, and the average increment of PbS detector is in direct proportion to the time of hydrothermal environment after 2 ×24 h. 3 × 24 h. 4 × 24 h. 5 × 24 h. Some samples have been failed after 7 × 24 h in hydrothermal environment.

关 键 词：湿热环境 暗电阻 PBS 光导探测器 性能可靠性 表面吸附 

分 类 号：TN215[电子电信—物理电子学]