基于Geant4程序模拟质子打薄靶能量和角度歧离  被引量:1

Geant4-based Simulation of the Energy and Angle Straggling of Proton on Thin Films

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作  者:张慧[1] 王振超[1] 关世荣[1] 梅雪松[1] 李欣 

机构地区:[1]黑龙江省科学院技术物理研究所,黑龙江哈尔滨150086 [2]牙克石林业第一中学物理组

出  处:《中国辐射卫生》2014年第4期297-298,302,共3页Chinese Journal of Radiological Health

基  金:黑龙江省科学院青年创新基金项目(CX12C03)

摘  要:目的讨论能量歧离和角度歧离与入射质子能量、靶材料及厚度的关系。方法利用Monte Carlo模拟软件Geant4,模拟100 keV^10 MeV质子垂直入射铍(Be)、碳(C)、水(H2O)、铝(Al)、铜(Cu)薄膜后的能量歧离值和角度歧离值。结果得到能量歧离和角度歧离与薄膜厚度、薄膜材料及入射质子能量的关系。结论能量歧离主要发生在入射质子100 keV^200 keV能量范围内,当薄膜厚度越大且薄膜材料原子序数越高时,能量歧离和角度歧离越大;当入射质子能量越大时,能量歧离和角度歧离越小。Objective Analysis of the relationship between the incident proton energy, target materials, the thickness of target materials and energy and angle straggling. Methods Using Geant4 program to simulate the incident proton energy of 100keV - 10 MeV vertically into Be,C ,H20,M ,Cu fihn. Results Obtaining the relationship between the incident proton energy, target materials, the thickness of target materials and energy and angle straggling. Conclusion Energy straggling mainly occurs in the range of energy from 100keV to 200keV. The greater the thickness of target materials and the electron density of target material are, the greater the energy and angle straggling is. Energy and angle straggling is also associated with the incident proton energy. The general trend is the greater incident proton energy, the smaller the energy and angle straggling.

关 键 词:Geant4模拟 质子 能量歧离 角度歧离 薄膜 

分 类 号:R811.1[医药卫生—放射医学]

 

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