基于谐振频率测量的SIMpass卡质量检测技术研究  

The Study of Quality Testing Technique for SIMpass Card Based on Frequency Deviation

作　　者：吴宁胜[1] 朱荔[2] 蒋志强[1] 

机构地区：[1]浙江商业职业技术学院,浙江杭州310053 [2]浙江机电职业技术学院,浙江杭州310053

出　　处：《电子技术（上海）》2015年第6期32-34,共3页Electronic Technology

摘　　要：SIMpass卡融合了射频RFID卡技术和SIM卡技术,在手机支付领域应用非常广泛。为了保证产品质量,在SIMpass卡生产和应用环节都需要进行批量筛选与测试。介绍了SIMpass卡原理及测试依据,提出了基于谐振频率测量进行质量检测的方法,并给出了详细的原理框图与软硬件设计方案。测试结果表明,检测方法可行,且易于低成本实现。SIMpass card, incorporated with RFID and SIM card techniques, has showed people most potential applications in mobile payments. In order to ensure the quality of SIMpass card, batch screening and testing are required in production and application.The principle and testing of SIMpass card is introduced. The method of SIMpass card quality testing based on resonant frequency deviation is presented.The designs of hardware and software as well as the block diagram are described concretely. Test results show that the detection method is feasible, low-cost and easy to implement.

关 键 词：SIMpass卡 质量检测 谐振频率测量 DDS 

分 类 号：TN4[电子电信—微电子学与固体电子学]