双层屏蔽厚度γ反解技术研究  

Study on the Gamma Passive Analysis for the Thickness of Two Layer Shield Materials

作　　者：张连平[1] 吴伦强[1] 韦孟伏[1] 

机构地区：[1]中国工程物理研究院,绵阳621900

出　　处：《核电子学与探测技术》2015年第4期322-324,330,共4页Nuclear Electronics & Detection Technology

摘　　要：分析高分辨(能谱获取测量对象特定信息在军控核查领域有重要应用,根据多组不同能峰强度比等信息反解给出源外屏蔽材料几何信息有望有效消除未知包装容器对容器内部材料特性认识的影响。分析建立了反解源外双层屏蔽厚度的方法,实验测量反解了钚源和^(152)Eu点源外双层屏蔽材料的厚度,^(152)Eu点源的解析结果明显优于钚源,分析了实验解析结果与实际厚度值之间存在一定偏差的原因。Acquiring the special information about measured object by gamma spectrum has important application in the field of arms control verification. The geometry information of the shield material out of source has been obtained by several group of intensity ratio of different energy gamma rays, which would reduce the affect for the evaluation of the inner assembly characteristic when the packaging is unknown. In this paper, the method of analyzing the thickness of several layers shield materials has been established, and the thickness of several layer shield materials out of plutonium source and mEu source has been analyzed based on the experiment, the result of the mEu source is better than the plutonium source obviously, the reason of the disagreement between the experiment result and the actual value has been analyzed.

关 键 词：多层屏蔽 γ反解 钚材料 能峰强度比 

分 类 号：O571.424[理学—粒子物理与原子核物理]