工业CT坐标精密测量技术  

A Survey on Precise Coordinate Measurement Technology by Industrial X-ray Computed Tomography

作　　者：苏宇航[1] 王倩妮[1] 何方成[1] 

机构地区：[1]北京航空材料研究院

出　　处：《计量学报》2015年第4期375-378,共4页Acta Metrologica Sinica

基　　金：北京航空材料研究院项目(KZ28140734)

摘　　要：介绍了基于X射线工业CT的坐标精密测量技术，讨论了该技术相对于传统三坐标测量技术的优势和不足及国内外的发展现状，对主要研究方向进行了探讨和研究，指出目前CT坐标测量中存在的问题，为评价测量不确定度提出了系统的解决思路。工业CT坐标精密测量测量技术在国内尚处于探索阶段，具有较大的发展空间和应用前景。A survey on precise measurement technology by industrial X-ray （XCT） computed tomography is presented, and comparison of the advantages and limits versus to the traditional CMMs. From published papers and information, the development nowadays in both sides is analyzed. This technology is not full-grown from globe, and there are many different issues to be focused on. And, it is obvious, that the technology of XCT in coordinate measurement has a great prospect in future development and utilization.

关 键 词：计量学 XCT 尺寸误差 坐标测量 校准 

分 类 号：TB92[一般工业技术—计量学]