锁相环敏感模块的单粒子效应与设计加固  

Single Event Effect and Radiation-Hard by Design of Sensitive Blocks for PLL

作　　者：鲍进华 李博[1] 曾传滨[1] 高林春[1] 毕津顺[1] 刘海南[1] 罗家俊[1] 

机构地区：[1]中国科学院微电子研究所,北京100029

出　　处：《半导体技术》2015年第7期547-553,共7页Semiconductor Technology

基　　金：国家自然科学基金资助项目(11179003;61176095)

摘　　要：应用于航天工程的锁相环（PLL）电路遭受太空高能粒子轰击时会发生单粒子效应（SEE）,引起电路失锁,对系统造成灾难性影响。分析了鉴频鉴相器（PFD）和分频器（DIV）模块的单粒子效应导致失锁的机理,运用改进的双互锁结构（DICE）的锁存器和冗余触发器电路分别对其进行设计加固（RHBD）,基于0.35μm CMOS工艺设计了加固的锁相环电路。仿真结果表明,加固PLL可以对输入20-40 MHz的信号完成锁定并稳定输出320-640 MHz的时钟信号。在250 f C能量单粒子轰击下加固后PFD模块不会造成PLL失锁,加固DIV模块的敏感节点数目降低了80%。Single event effect（ SEE） occurs when high energy particles penetrate phase locked loops（ PLLs） applied to aerospace,causing PLLs to lose lock and even resulting in catastrophic damages for electronic systems. The lock mechanism introduced by the SEE of the phase frequency detector（ PFD）and divider（ DIV） was analyzed,and radiation-hard by design（ RHBD） approaches were performed for PFD and DIV blocks by using dual interlocked storage cell（ DICE） latch and redundancy flip-flops. A radiation-hard PLL was designed based on 0. 35 μm CMOS process. The simulation results show that the radiation-hard PLL can lock input signal with frequency from 20 MHz to 40 MHz while generates output signal with frequency from 320 MHz to 640 MHz. The radiation-hard PLL maintains in lock after 250 f C single particles strike at PFD,and the amount of sensitive nodes of DIV reduce by 80%.

关 键 词：锁相环(PLL) 鉴频鉴相器(PFD) 分频器(DIV) 单粒子效应(SEE) 设计加固(RHBD) 

分 类 号：TN432[电子电信—微电子学与固体电子学] TN402