超低副瓣天线平面近场测量采样间距误差分析  

Error Analysis of Sampling Spacing of Ultra-low Sidelobe Antenna in Planar Near-field Measurement

作　　者：刘浩[1] 陈玉林[1] 

机构地区：[1]中国电子科技集团公司第38研究所,合肥230088

出　　处：《舰船电子对抗》2015年第3期27-29,共3页Shipboard Electronic Countermeasure

基　　金：总装备部"十二五规划"雷达探测项目;项目编号:51307060505

摘　　要：基于超低副瓣天线测试对精度的要求,利用计算机模拟的方法研究了平面近场测量中采样间距误差对超低副瓣天线副瓣的影响,得到了一些规律和有用的结果,并证明了Nyquisty采样定理在超低副瓣天线测试中的适用性和正确性。Based on the precision requirement of ultra-low sidelobe antenna measurement,this paper studies the influence of sampling spacing error on the sidelobe of ultra-low sidelobe antenna in planar near-field measurement by means of computer simulation,acquires some laws and useful results,and proves the applicability and correctness of Nyquisty sampling theory in ultra-low sidelobe antenna measurement.

关 键 词：采样间距 超低副瓣天线 平面近场测量 误差分析 

分 类 号：TN820[电子电信—信息与通信工程]