CsI探测器余辉性能测试仪关键技术研究与实现  

Research and Implementation of Afterglow Tester for Cs I Detector

作　　者：郑海东[1] 史运峰 霍梅春[1] 李昊[1] 

机构地区：[1]公安部第一研究所,北京100048

出　　处：《机电产品开发与创新》2015年第4期26-28,共3页Development & Innovation of Machinery & Electrical Products

摘　　要：为检测Cs I(Tl)探测器的余辉性能,帮助探测器进行分档,论文通过对余辉测试仪设计过程中的电动缸选型计算、射线屏蔽、电磁兼容设计等关键问题进行分析,自主研发了一台Cs I探测器余辉测试仪。该测试仪快门关断时间≦3ms;可测余辉值的时间范围:5ms^500ms。并能对采集数据进行分析,得到探测器晶体各像素的余辉和平均余辉,及其变化曲线。余辉测试仪的检测结果将为安检整机提供具有数据信息的系列探测板,促进其图像质量更上一层楼。A new Afterglow Tester was developed in order to test the afterglow of Cs I Detector and classify the Detector. The key technical issues include selection calculation for electric cylinder, X-ray shielding and EMC Design. The tester＇s shutter off time is less than 3ms, time rang of measurable afterglow： 5ms-500 ms. Afterglow of each pixel and average afterglow of the detector were got through data analysis by a computer software, as well as curves and trends of afterglow. The output of the afterglow tester will provide a series of detector board with specific data information which will promote a higher level of image quality of security inspection.

关 键 词：CsI(Tl)闪烁晶体 余辉 电动缸 射线屏蔽 

分 类 号：TM938[电气工程—电力电子与电力传动]