面向缺陷集簇分布的CMOL电路容错映射算法  

Defect-tolerant Mapping Algorithm of CMOL Circuit Oriented to Defect Clusters Distribution

作　　者：苏蒙蒙[1] 夏银水[1] 储著飞[1] 

机构地区：[1]宁波大学信息科学与工程学院,浙江宁波315211

出　　处：《计算机工程》2015年第8期244-251,共8页Computer Engineering

基　　金：国家教育部博士点基金资助项目(20113305110001)

摘　　要：为提高CMOS/纳米线/分子混合电路的成品率,提出一种基于分段蛇形编码的容错映射算法。根据纳米阵列缺陷分布的集簇性特点,给出缺陷整体分类方法。在阵列连通域的约束条件下对电路进行分段蛇形编码以避开缺陷单元,提高电路映射边的成功率,获得优化的初始映射解。依据目标函数设定违反约束映射边的惩罚系数,并采用自适应遗传算法对解空间进行搜索,实现电路的容错映射。ISCAS89标准电路的测试结果表明,与现有容错映射算法相比,该算法在运行时间、电路规模和映射成功率方面均具有较高的性能优势。In order to effectively improve the yield of CMOS/nanowire/MOLecular hybrid（CMOL） circuit,this paper proposes a defect-tolerant mapping algorithm based on segmented serpentine coding. According to the clustering characteristics of defects distribution,the classification method of defect clusters distribution is presented to realize segmented serpentine coding. It avoids defective cells under the nano-array connectivity domain constraints,improves the success rate of the circuit mapping edges,and obtains optimized initial mapping solutions. It sets the constraint-violated penalties of mapping edges,establishes objective function,employs adaptive genetic algorithm to search the solution space,and realizes circuit defect-tolerant mapping. Compared with existing defect-tolerant mapping algorithm,the proposed algorithm has great performance on the aspects of run time,circuit scale and mapping success rate by testing the ISCAS89 standard circuits.

关 键 词：CMOS/纳米线/分子混合电路 缺陷率 分段蛇形编码 初始解 容错映射 

分 类 号：TP391[自动化与计算机技术—计算机应用技术]