CT技术结合MC模拟探测器效率刻度曲线  

CT Technology Combined with MC Simulation Efficiency of Detector Calibration Curve

作　　者：陈成[1,2] 吴金杰[2] 周四春[1] 姚馨博 王佳[2,4] 

机构地区：[1]成都理工大学,成都610059 [2]中国计量科学研究院,北京100013 [3]河北科技大学,石家庄050018 [4]南华大学,衡阳421000

出　　处：《核电子学与探测技术》2015年第5期490-494,共5页Nuclear Electronics & Detection Technology

基　　金：质检公益性行业科研专项(201210003);中国计量科学研究院基本科研业务费(25-AKY1307)资助

摘　　要：探测器效率直接关系到物理测量结果的精确度,受生产厂家给出的探测器结构数据完整性、精确性限制,导致不能完整的建立MC模型。利用计算机断层成像装置(CT),完整的呈现探测器内部3D、2D结构图,可测得所有相关结构参数。实验结果表明:Xview X5000型号工业CT测量系统最大分辨率优于1μm,测量的数据与出厂参数相对误差都在±1.5%内;此外,采用不同灰度颜色凸显结构分布,通过3D切片建立2D结构剖面图,可精确的获取探测器内部的形状、位置、尺寸等信息,为MC模拟、物件缺陷检测、结构分析提供了有力的保障。The detector efficiency is directly related to the accuracy of the results of the physical measurements. The integrity and accuracy of the detector structure data arc limited by the manufacturer, led to the result that the establishment of a Monte Carlo model cannot be completed. Using computer tomography apparatus （ CT）, completely internal detector 3D, 2D structure diagram can be obtained, which can be recover all the relevant structural parameters. The experimental results show that： the maximum resolution is better than 1 um by using Xview XS000 industrial CT measurement system, the relative error of the actual parameters is within 1.5% ; in addition, using different gray color highlights the structure distribution, the establishment of 2D profile by 3D slices, can accurately obtain the shape, position, size and other information of the detector. As approved by the Monte Carlo simulation, detection and structure analysis of object defects can be strongly guaranteed.

关 键 词：CT成像原理 探测器CT结构图 测量精度 探测效率曲线 

分 类 号：TL99[核科学技术—核技术及应用]