低压终端隔离开关的可靠性改进  

Improvement on Reliability of a Low Voltage Terminal Disconnecting Switch

作　　者：朱文灏[1,2] 陈雷 郭其一[1] 

机构地区：[1]同济大学电子与信息工程学院,上海201804 [2]上海施耐德低压终端电器有限公司,上海201109

出　　处：《电气开关》2015年第4期41-44,共4页Electric Switchgear

摘　　要：分析了传统低压终端隔离开关的结构特点、存在的可靠性问题,并针对此提出了一种改进的结构。改进方案简化了产品电路机构,解决了触头运动不平衡问题,改进了触头烧损问题。并采用快速闭合机构和引弧角,大大减少了电弧产生,显著减小了隔离开关的熔焊问题,从而提高了隔离开关的可靠性和使用寿命。Base on the analysis of traditional disconnecting switch structure and the existing reliability problem, this article propose a new structure for improvement. The improved structure solve the imbalance problem of contact moving, and reduce the contact burn up issue. The fast close mechanism is used, thus the arc is greatly reduced during the contact closing. This structure implemented in final distribution disconnecting switch can solve the contact welding problem and improve the disconnecting switch reliability and prolong its life-span.

关 键 词：隔离开关 可靠性 结构改进 快速闭合 引弧 

分 类 号：TM564[电气工程—电器]