基于边界扫描技术的测试性优化方法研究  

Study of Testability Optimization Method Based on Boundary Scan Technology

作　　者：刘磊峰[1] 谢永成[2] 李光升[1] 魏宁[1] 

机构地区：[1]装甲兵工程学院控制工程系,北京100072 [2]装甲兵工程学院外训系,北京100072

出　　处：《计算机测量与控制》2015年第8期2607-2609,2613,共4页Computer Measurement &Control

摘　　要：针对基于边界扫描测试技术对集成电路测试复杂的问题,提出了贪婪算法和图的色素理论算法;贪婪算法是指在测试网络与器件之间建立一个矩阵模型,通过局部最优解来寻找全局最优解的一种算法;图的色素理论是借助图的色数理论和技术,通过图形绘制网络与器件的关系,从中寻找最少着色方案的一种算法;实验结果表明,贪婪算法和图的色素理论两种算法的应用都能够较好地解决电路板测试性复杂性和测试性完备性问题,具有很强的实用性,可用于复杂数字电路板测试。Established a greed algorithm and a pigment of graph theory algorithm which can solve the problem of integrated circuit based on boundary scan. Greed algorithm means to establish a matrix model between test network and components, and find a global optimal solu- tion by local optimal solution through the matrix. The pigment of graph theory algorithm means to use the theory and technology of pigment of graph, to find a minimum of coloring algorithm by drawing a relationship between network and components through the graph It was proved that the greed algorithm and the pigment of graph theory algorithm were the good solution to solve the test complexity and the test completeness of the circuit board. And these two algorithms were so practical that can be used in complex digital circuit test.

关 键 词：边界扫描 测试性复杂性 测试性完备性 

分 类 号：TP751[自动化与计算机技术—检测技术与自动化装置]