功能覆盖率驱动的自适应遗传算法验证技术  

Adaptive Genetic Algorithm Verification Technology Driven by Functional Coverage

作　　者：吴剑浪[1] 石景恺 康怀祺[1] 

机构地区：[1]电子科技大学电子科学技术研究院,成都611731

出　　处：《微电子学》2015年第4期529-532,共4页Microelectronics

基　　金：航空科学基金资助项目(20090580013;20110580002);中央高校基础研究基金资助项目(ZYGX2009J092)

摘　　要：根据不同功能测试点在芯片代码中的逻辑深度与相应测试向量覆盖到的测试点多少的关系,对不同测试点设置了相应的权重,提出一种基于自适应遗传算法的激励向量生成方法。实验结果表明,该方法能减少编写约束文件时间,较快自动搜索有针对性的测试激励,提高芯片功能验证的可靠性和仿真效率。Different weights were appropriately set based on the relationship between the code logical depth of function test points and the test points covered by a test vector. A test vector generation method based on adaptive genetic algorithm was proposed. The experimental results showed that the method could reduce the time of writing constraint files and auto-generate a stimulation, which was more efficient and targeted. The method had improved the efficiency and reliability of the chip functional verification.

关 键 词：代码逻辑深度 测试点权重 功能覆盖率 自动测试 遗传算法 

分 类 号：TN407[电子电信—微电子学与固体电子学]