Modeling of channel mismatch in time-interleaved SAR ADC  

作　　者：李登全 张靓 朱樟明 杨银堂 

机构地区：[1]School of Microelectronics,Xidian University

出　　处：《Journal of Semiconductors》2015年第9期136-142,共7页半导体学报（英文版）

基　　金：Project supported by the National Natural Science Foundation of China(Nos.61234002,61322405,61306044,61376033);the National High-Tech Program of China(No.2013AA014103)

摘　　要：In a time-interleaved analog-to-digital converter （TI ADC）, several individual ADCs operate in parallel to achieve a higher sampling rate. Low power consumption as well as good linearity can be obtained by applying successive approximation register （SAR） converters as sub-channel ADCs. In spite of the advantages, this structure suffers from three mismatches, which are offset mismatch, gain mismatch, and time skew. This paper focuses on a TI SAR ADC with a number of channels. The mismatch effects in the frequency domain are analyzed and the derived close form formulas are verified based on Matlab. In addition, we clarify that the standard deviation of DNL and INL of an M-channel TI ADC is reduced by a factor of ~ compared to a single channel ADC. The formulas can be used to derive the corresponding requirements when designing a TI ADC. Our analysis process is able to inform the study of calibration algorithms.In a time-interleaved analog-to-digital converter （TI ADC）, several individual ADCs operate in parallel to achieve a higher sampling rate. Low power consumption as well as good linearity can be obtained by applying successive approximation register （SAR） converters as sub-channel ADCs. In spite of the advantages, this structure suffers from three mismatches, which are offset mismatch, gain mismatch, and time skew. This paper focuses on a TI SAR ADC with a number of channels. The mismatch effects in the frequency domain are analyzed and the derived close form formulas are verified based on Matlab. In addition, we clarify that the standard deviation of DNL and INL of an M-channel TI ADC is reduced by a factor of ~ compared to a single channel ADC. The formulas can be used to derive the corresponding requirements when designing a TI ADC. Our analysis process is able to inform the study of calibration algorithms.

关 键 词：analog-to-digital converter time interleaved successive approximation register channel mismatch 

分 类 号：TN792[电子电信—电路与系统]