一种面向TTL集成电路的小型检测仪设计  

Design of a Small Trouble Testing System Orientd for TTL Integrated Circuits

作　　者：孙韩[1] 朱军[1] 

机构地区：[1]安徽大学电子信息工程学院,合肥230601

出　　处：《办公自动化》2015年第16期35-36,共2页Office Informatization

摘　　要：本文基于MCS51单片机,构建了一种面向TTL集成短路芯片的小型检测仪。该检测仪能快速、准确地对TTL系列数字逻辑芯片的逻辑功能进行检测,从而判断芯片的好坏和型号。该检测仪的使用,能减少了测试时间,提高了检测效率,降低了劳动强度。该检测仪具有良好的移植和扩展性。The design is based on MCS51 MCU, construct the digital ICs trouble testing system design for the TI＇L. This system can test logic function of TI＇L series digital logic chip fast and accurate, judge the quality and model of the chip. The use of the detector can reduce the test time, improve the detection efficiency, reduce the labor intensity. The detector has good transplantation and expansibility.

关 键 词：集成电路 故障检测 MCS51单片机 

分 类 号：TN431.2[电子电信—微电子学与固体电子学] TH89[机械工程—仪器科学与技术]