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作 者:Muhammad FAROOQ Aasma ASLAM Babar HUSSAIN Ghazanfar HUSSAIN Masroor IKRAM
机构地区:[1]National Institute of Lasers and Optronics, Lehtrar Road, lslamabad, 45650, Pakistan [2]Hazara University, Mansehra and NUST, lslamabad, 21300, Pakistan [3]University of North Carolina at Charlotte, Department of Electrical and Computer Engineering, 9201 University City Boulevard, Charlotte, 28223, USA [4]pakistan Institute of Engineering and Applied Sciences, lslamabad, 45650, Pakistan
出 处:《Photonic Sensors》2015年第4期304-311,共8页光子传感器(英文版)
摘 要:We present a comparison of different techniques for the analysis of the shift and tilt in optical interference fringes. Fringe center, Radon transform, and Gaussian approximation methods are used for fringe analysis. We have measured the tilt and shift between two relevant fringe pattems. The error in tilt measurement was about 2%, and the displacement of the order of few nanometers was measured by the fringe shift analysis. The comparison between the techniques is analyzed with respect to percentage error.We present a comparison of different techniques for the analysis of the shift and tilt in optical interference fringes. Fringe center, Radon transform, and Gaussian approximation methods are used for fringe analysis. We have measured the tilt and shift between two relevant fringe pattems. The error in tilt measurement was about 2%, and the displacement of the order of few nanometers was measured by the fringe shift analysis. The comparison between the techniques is analyzed with respect to percentage error.
关 键 词:INTERFEROMETRY FRINGES TILT SHIFT IMAGING
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