0.1 THz功率探头温度分布的ANSYS仿真分析  

Modelling and Simulation of Temperature Distribution in 0.1 THz Power Probe

作　　者：马思园 王自成[1] 罗积润[1] 冯彤[1,2] 

机构地区：[1]中国科学院电子学研究所,北京100190 [2]中国科学院大学,北京100039

出　　处：《真空科学与技术学报》2015年第9期1064-1068,共5页Chinese Journal of Vacuum Science and Technology

基　　金：国家自然科学基金(批准号:61172016)资助的课题

摘　　要：基于ANSYS有限元分析软件的热分析功能,在匹配吸收和材料高温环境稳定工作的条件下,对0.1 THz波功率探头两种不同结构的功率敏感体进行建模,在0~50 m W输入功率条件下,仿真计算它们的温度分布,通过比较温差大小、达到温度平衡稳定的时间以及材料的温度承受能力等,确定哪种结构使探头性能更好,能更准确地定标。The temperature distribution of the 0. 1 THz power probe,heated at an input power in 0 ~ 50 mW range, was approximated,modeled,analyzed in thermal dynamics and simulated in finite element method with software ANSYS. The impact of the heating conditions, including the Types-I and II structures of the power sensitive strip, thermal proper- ties of the components and power density, on the temperature distribution, heating and cooling rates was thoretically calcu- lated and numerically simulated. The simulated and calculated results of Type-I and Type-II strips were found to be in good agreement with a dicrepancy about 1.12% ~ 1.15%. In addition to the heat tolerance ability of the sensor material, the 6-variables of the two strips, including the highest and lowest temperatures heated at a fixed power; the temperatures measured at the ＂head and tail＂ of the strips,heat balance time and cooling time, were compared. When it comes to per- formance and calibration, we suggest that Type-II may outperform Type-I of the power sensitive strip.

关 键 词：THZ波 功率探头 有限元分析 温度分布 

分 类 号：O551.2[理学—热学与物质分子运动论]