基于拓扑二值逻辑的电工实验台短路故障定位方法  

Research on the Fault Location of Short-Circuit for the Electrical Test Bench Based on Topology & Binary Logic

作　　者：黄俊奇 

机构地区：[1]上海第二工业大学科研处,上海201209

出　　处：《上海第二工业大学学报》2015年第3期236-242,共7页Journal of Shanghai Polytechnic University

摘　　要：针对电工实验台在高校教学过程中发生短路故障后很难快速、准确找到故障位置的问题,通过分析实验系统中短路电流的流向以及电路结构的特点,提出了一种基于拓扑二值逻辑的电工实验台短路故障定位方法。该方法能够很好地解决传统故障定位方法故障定位不准确的问题,并可在复杂拓扑结构电路中实现快速故障定位。实验结果表明,该故障定位方法电路结构简单,故障定位快速准确,且定位过程不易受外界环境干扰,具有较好的实际效果。Aiming at the problem of difficult to find the fault location quickly and accurately in the electrical test bench after the short-circuit fault occurs during the teaching of colleges, through the analysis of the flow mechanism of short-circuit current and the characteristics of the circuit structure in the system, a short-circuit fault location method for the electrical test bench base on topology ＆ binary logic is presented. The method can not only solve the problem of inexact location with traditional fault diagnosis methods, but also provide the quick fault locating for the complex topology circuit. The experimental results show that this method have the advan- tages of simple circuit structure and the fault position is fixed quickly and preciously. It is not influenced by the outside environment during fault locating and have a better actual effect.

关 键 词：故障定位 电工实验台 强电系统 拓扑结构 二值逻辑 

分 类 号：TM930.7[电气工程—电力电子与电力传动]