拉伸纳米掺杂三层复合PI薄膜的介电性能  

The Impact of Tensile on Dielectric Properties of Nano-Hybrid Polyimide Three-layer Composite Films

作　　者：范勇[1] 王欢[1] 武传刚[1] 杨瑞宵[1] 陈昊[1] 

机构地区：[1]哈尔滨理工大学材料科学与工程学院,黑龙江哈尔滨150040

出　　处：《哈尔滨理工大学学报》2015年第4期25-29,共5页Journal of Harbin University of Science and Technology

基　　金：国家自然科学基金(50373008;51277044)

摘　　要：对部分亚胺化的纳米Al/Si掺杂三层复合聚酰胺酸薄膜进行拉伸处理(拉伸比为:横向5%,纵向2.5%),然后经高温闭环,制得一系列不同厚度的拉伸和未拉伸三层复合PI薄膜.在相同的环境条件下测试电导电流、介电谱和耐电晕老化寿命,研究掺杂层厚度和拉伸比例对复合薄膜介电性能的影响.结果表明:对于未拉伸的薄膜,随着掺杂层厚度的增加,电老化阈值略有下降、耐电晕寿命明显的提高;在相同场强下,电导电流随着掺杂层厚度的增加而增大.对于相同厚度的薄膜,拉伸也会使电导电流增大、电老化阈值略有减小,拉伸也使得耐电晕寿命明显的提高.在本实验范围内,拉伸对复合薄膜介电性能的影响,类似于增加掺杂层厚度的作用.The drawn composite films with different thickness were prepared by drawing nano-hybrid polyamide acid three-layer composite film and then through the ring closing reaction in the high temperature（ draw ratio： 5 % transverse direction, 2. 5 % longitudinal）. In the same condition, the dielectric properties were measured by tes- ting conduction current, dielectric spectroscopy, and corona resistant, to study the impact of tensile and thickness on the dielectric properties of nano-hybrid polyimide composite film. The results showed that ： for the undrawn com- posite films, within the increase of doped layer thickness, the electrical degradation threshold showed a decreasing trend, the corona resistance was significantly improved, under the same electric field strength, the conduction cur- rent of composite films increased with doped layer thickness increasing. For the drawn composite films with the same doped thickness, the conduction current of composite films relative increased; the electrical degradation threshold was slightly decreased; While, the corona resistant were enhanced obviously. So effect on the dielectric properties of the films, tensile was equivalent to increase the thickness of the doping layer.

关 键 词：拉伸 聚酰亚胺薄膜 介电性能 耐电晕 

分 类 号：TM215.3[一般工业技术—材料科学与工程]